Currently existing approaches to the construction of x-ray diagnostic systems do not allow to combine in one product characteristics such as: - reduce x-ray dose by an order of magnitude, - reduction f the focal spot x-ray tube to a value of 0.1*0.1 mm and less in the millisecond time shooting the x-ray image; - decrease integral radiation power of the image frame coinciding with the period of radiation without increasing the instantaneous power of x-ray tube; - increasing resolution, dynamic x-ray detectors with a simultaneous increase in the speed of frames per second; - reducing the value of the ratio signal/noise and to increase the resolution of diagnostic images through mathematical processing of images. The output from the system of constraints is only possible through the creation of a new class of x-ray diagnostic systems, built on technology “Microsecond Radiology”, which incorporates the best of all three rentgenologii – Standard, Microfocus and Nanosecond rentgenology.