The present work proposes designs and implements a novel microwave based material characterization technique. By connecting a klystron based microwave source to a transmitter antenna, a turn table rotates the sample to be characterized, placed in the radiation field of the antenna, by 360 degrees. A receiver antenna then collects the scattered radiation, and the distribution of intensity for various angles is recorded using power meter. Nonlinear analysis techniques such as spectrum, phase portrait, polar plot and Lyapunov exponents are then used to characterize the crystalline/amorphous nature of the sample. The techniques are validated for nanostructured samples of Titanium Oxide as well as Zinc Oxide based thin films. It is hoped that these preliminary results will lay the foundation steps towards microwave based material characterization, with the significant advantage of lesser health hazard compared with X-Ray based techniques.