Classical Physics

    

New One Probe Method and Instruments for Instant In-Circuit Measuring Quality of Capacitors.

Authors: Mark Krinker

The paper considers a physical base of new approach to testing capacitors in-circuit as well as the appropriate instruments. The method is based on injecting the probing current through an envelope of the capacitors due to polarization processes of associated conducted surface of the circuitry. This is a first one-probe In-Circuit Method. Special instruments, realizing the Method are also considered.

Comments: 13 Pages. Exploitation of the Method and Instruments since 1996 considerably increased a rate of troubleshooting in computer-maintenance company.

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Submission history

[v1] 2014-04-01 11:52:15

Unique-IP document downloads: 236 times

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